<manifestation xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:tucdl="http://purl.tuc.gr/dl/dias/schemas/aip/tucdl/" xmlns="http://purl.tuc.gr/dl/dias/schemas/aip/tucdl/" keyIdentifier="http://purl.tuc.gr/dl/dias/8ADFD940-94F9-46D1-80C7-0F37A60E810A" xsi:schemaLocation="http://purl.tuc.gr/dl/dias/schemas/aip/tucdl/ http://purl.tuc.gr/dl/dias/schemas/aip/tucdl"><titleOfTheManifestation>Nikolaou_Aristeidis_Dip_2016.pdf</titleOfTheManifestation><isEmbodimentOf entityType="Expression"><uri>http://purl.tuc.gr/dl/dias/C430AFDB-1CC3-4699-A38D-14E806CF17E7</uri><title xml:lang="en">Στατιστική μελέτη θορύβου χαμηλής συχνότητας σε Enclosed Gate MOSFETs </title></isEmbodimentOf><accessRestrictionOnTheManifestation>embargo</accessRestrictionOnTheManifestation><dateOfPublicationDistribution>2016-09-05</dateOfPublicationDistribution><formOfCarrier>binary/octet-stream</formOfCarrier><extentOfTheCarrier xml:lang="en">3.0 MB</extentOfTheCarrier></manifestation>