<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235"><efrbr-work:titleOfTheWork>CJM: a compact model for double-gate junction FETs</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235"><efrbr-expression:titleOfTheExpression>CJM: a compact model for double-gate junction FETs</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Peer-Reviewed Journal Publication
            Δημοσίευση σε Περιοδικό με Κριτές
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2020-10-29</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">2019</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>The double-gate (DG) junction field-effect transistor (JFET) is a classical electron device, with a simple structure that presents many advantages in terms of device fabrication but also its principle of operation. The device has been largely used in low-noise applications, but also more recently, in power electronics. Furthermore, co-integration of JFET with CMOS technology is attractive. Physics-based compact models for JFETs are however scarce. In this paper, an analytical, charge-based model is established for the mobile charges, drain current, transconductances and transcapacitances of symmetric DG JFETs, covering all regions of device operation, continuously from subthreshold to linear and saturation operation. This charge-based JFET model (called CJM) constitutes the basis of a full compact model of the DG JFET for analog, RF, and digital circuit simulation.</efrbr-expression:summarizationOfContent><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="journal name">IEEE Journal of the Electron Devices Society</efrbr-expression:note><efrbr-expression:note type="journal volume">7</efrbr-expression:note><efrbr-expression:note type="page range">1191-1199</efrbr-expression:note></efrbr-expression:expression><efrbr-manifestation:manifestation identifier="https://dias.library.tuc.gr/view/87281"><efrbr-manifestation:titleOfTheManifestation>Makris_et_al_IEEE J. Electron Devices Soc._7_2019.pdf</efrbr-manifestation:titleOfTheManifestation><efrbr-manifestation:publicationDistribution><efrbr-manifestation:placeOfPublicationDistribution type="distribution">Chania [Greece]</efrbr-manifestation:placeOfPublicationDistribution><efrbr-manifestation:publisherDistributor type="distributor">Library of TUC</efrbr-manifestation:publisherDistributor><efrbr-manifestation:dateOfPublicationDistribution>2020-10-28</efrbr-manifestation:dateOfPublicationDistribution></efrbr-manifestation:publicationDistribution><efrbr-manifestation:formOfCarrier>application/pdf</efrbr-manifestation:formOfCarrier><efrbr-manifestation:extentOfTheCarrier>5.7 MB</efrbr-manifestation:extentOfTheCarrier><efrbr-manifestation:accessRestrictionsOnTheManifestation>free</efrbr-manifestation:accessRestrictionsOnTheManifestation></efrbr-manifestation:manifestation><efrbr-person:person identifier="http://users.isc.tuc.gr/~NMakris"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Makris Nikolaos
            Μακρης Νικολαος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~mbucher"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Bucher Matthias
            Bucher Matthias
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/68145304358278570306"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Jazaeri, Farzan 1984-
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/1057145857143022922975"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Sallese, Jean-Michel 1964-
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-corporateBody:corporateBody identifier="https://v2.sherpa.ac.uk/id/publisher/38"><efrbr-corporateBody:nameOfTheCorporateBody vocabulary="S/R:PUBLISHERS">
            Institute of Electrical and Electronics Engineers
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody><efrbr-concept:concept identifier="D6187320-4A03-4428-A248-8F52E7B76209"><efrbr-concept:termForTheConcept>
            Charge-based model
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="1DA93DE1-8068-4F46-AB55-E3F259413764"><efrbr-concept:termForTheConcept>
            Circuit simulation
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="17E8A8CF-72D1-4330-82E3-E1CF8ADEB800"><efrbr-concept:termForTheConcept>
            CJM model
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="E0885431-3B7F-4133-A2A1-DF628EB12F24"><efrbr-concept:termForTheConcept>
            Compact model
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="DA8466BE-FD0F-4CC9-9C9A-B1246661B413"><efrbr-concept:termForTheConcept>
            Depletion mode
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="7E0D139B-2CE7-465F-B930-0BA9DFEC2DD5"><efrbr-concept:termForTheConcept>
            Double gate
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="E8D17504-8535-4C57-8C0B-1899CFAB6A0C"><efrbr-concept:termForTheConcept>
            High frequency
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="12C0FDC6-47DC-43D3-AF98-0137D26D1110"><efrbr-concept:termForTheConcept>
            JFET
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="A4D3A730-723C-4A0F-84DD-CAA869D79DF7"><efrbr-concept:termForTheConcept>
            Junction field effect transistor
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="5431C388-93D1-4C29-8815-8E93304D69BE"><efrbr-concept:termForTheConcept>
            Low noise
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="A65BCFC4-FBE3-48EF-BEB3-FC5BD65761EA"><efrbr-concept:termForTheConcept>
            Verilog-A
         </efrbr-concept:termForTheConcept></efrbr-concept:concept></efrbr:entities><efrbr:relationships><efrbr-structure:structureRelations><efrbr-structure:realizedThrough sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="expression" targetURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235"/><efrbr-structure:embodiedIn sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="manifestation" targetURI="http://purl.tuc.gr/dl/dias/1375557B-DB7E-4656-B623-77C6190C6027"/></efrbr-structure:structureRelations><efrbr-responsible:responsibleRelations><efrbr-responsible:createdBy sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="http://users.isc.tuc.gr/~NMakris"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="http://users.isc.tuc.gr/~NMakris" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="http://users.isc.tuc.gr/~mbucher" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="http://viaf.org/viaf/68145304358278570306" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="http://viaf.org/viaf/1057145857143022922975" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="person" targetURI="https://v2.sherpa.ac.uk/id/publisher/38" role="publisher"/></efrbr-responsible:responsibleRelations><efrbr-subject:subjectRelations><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="D6187320-4A03-4428-A248-8F52E7B76209"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="1DA93DE1-8068-4F46-AB55-E3F259413764"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="17E8A8CF-72D1-4330-82E3-E1CF8ADEB800"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="E0885431-3B7F-4133-A2A1-DF628EB12F24"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="DA8466BE-FD0F-4CC9-9C9A-B1246661B413"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="7E0D139B-2CE7-465F-B930-0BA9DFEC2DD5"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="E8D17504-8535-4C57-8C0B-1899CFAB6A0C"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="12C0FDC6-47DC-43D3-AF98-0137D26D1110"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="A4D3A730-723C-4A0F-84DD-CAA869D79DF7"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="5431C388-93D1-4C29-8815-8E93304D69BE"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/D7AA08D3-1073-4395-B202-EA4ECB7A1235" targetEntity="concept" targetURI="A65BCFC4-FBE3-48EF-BEB3-FC5BD65761EA"/></efrbr-subject:subjectRelations><efrbr-other:otherRelations/></efrbr:relationships></efrbr:recordSet>