<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D"><efrbr-work:titleOfTheWork>Charge-based modeling of long-channel symmetric double-gate junction FETs-Part II: total charges and transcapacitances</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D"><efrbr-expression:titleOfTheExpression>Charge-based modeling of long-channel symmetric double-gate junction FETs-Part II: total charges and transcapacitances</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Peer-Reviewed Journal Publication
            Δημοσίευση σε Περιοδικό με Κριτές
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2019-09-02</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">2018</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>A compact model for the dynamic operation of double-gate junction field-effect transistors is established in this paper. Analytical model expressions are developed for the total node charges and transcapacitances valid from subthreshold to above threshold and from linear to saturation operation. The model is shown to conserve symmetry among source and drain, and circumvents problems at zero drain-to-source bias.</efrbr-expression:summarizationOfContent><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="journal name">IEEE Transactions on Electron Devices</efrbr-expression:note><efrbr-expression:note type="journal volume">65</efrbr-expression:note><efrbr-expression:note type="journal number">7</efrbr-expression:note><efrbr-expression:note type="page range">2751-2756</efrbr-expression:note></efrbr-expression:expression><efrbr-person:person identifier="http://users.isc.tuc.gr/~NMakris"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Makris Nikolaos
            Μακρης Νικολαος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/68145304358278570306"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Jazaeri, Farzan 1984-
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/1057145857143022922975"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Sallese, Jean-Michel 1964-
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~mbucher"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Bucher Matthias
            Bucher Matthias
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-corporateBody:corporateBody identifier="http://www.ieee.org/index.html"><efrbr-corporateBody:nameOfTheCorporateBody vocabulary="S/R:PUBLISHERS">
            Institute of Electrical and Electronics Engineers
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody><efrbr-concept:concept identifier="2D41C4BA-C66B-4036-8457-8710A859BC35"><efrbr-concept:termForTheConcept>
            Analytical model
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="F971E96C-14E4-4E42-929E-C13CF98A6E3B"><efrbr-concept:termForTheConcept>
            Circuit simulation
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="6771D350-FA98-475F-BC2A-2771186B5C65"><efrbr-concept:termForTheConcept>
            Dynamic model
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="FD0839A9-5D2F-418B-B74D-9F2A694B575B"><efrbr-concept:termForTheConcept>
            High frequency
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="9DD5FAC1-FE5D-4D2F-B946-2F4C1BF11DBA"><efrbr-concept:termForTheConcept>
            Junction field-effect transistor (JFET)
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="E85FB929-BDEB-42F8-B5C9-1C77BE73B6A1"><efrbr-concept:termForTheConcept>
            Transcapacitance 
         </efrbr-concept:termForTheConcept></efrbr-concept:concept></efrbr:entities><efrbr:relationships><efrbr-structure:structureRelations><efrbr-structure:realizedThrough sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="expression" targetURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D"/></efrbr-structure:structureRelations><efrbr-responsible:responsibleRelations><efrbr-responsible:createdBy sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://users.isc.tuc.gr/~NMakris"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://users.isc.tuc.gr/~NMakris" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://viaf.org/viaf/68145304358278570306" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://viaf.org/viaf/1057145857143022922975" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://users.isc.tuc.gr/~mbucher" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="person" targetURI="http://www.ieee.org/index.html" role="publisher"/></efrbr-responsible:responsibleRelations><efrbr-subject:subjectRelations><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="2D41C4BA-C66B-4036-8457-8710A859BC35"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="F971E96C-14E4-4E42-929E-C13CF98A6E3B"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="6771D350-FA98-475F-BC2A-2771186B5C65"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="FD0839A9-5D2F-418B-B74D-9F2A694B575B"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="9DD5FAC1-FE5D-4D2F-B946-2F4C1BF11DBA"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/8359EE6E-3589-4084-809F-B31E5F50142D" targetEntity="concept" targetURI="E85FB929-BDEB-42F8-B5C9-1C77BE73B6A1"/></efrbr-subject:subjectRelations><efrbr-other:otherRelations/></efrbr:relationships></efrbr:recordSet>