X-ray powder crystallography with vertex instrumentationX-ray powder crystallography with vertex instrumentation Peer-Reviewed Journal Publication Δημοσίευση σε Περιοδικό με Κριτές 2015-12-031998enAn X-ray Diffractometer for Powder Crystallography is described along with experimental results and future plans. This is an intermediate instrument toward a long linear array system. Three channels of a silicon microstrip detector, are the detecting elements in the present instrument. Each detector channel is followed by a VLSI readout chain, which consists of a charge preamplifier with pulse shaping circuitry, a discriminator, and a 16-bit counter. Control and data acquisition is performed with a custom made PC readout card. A motorized goniometer scans the angle range of interest. Calibration of the system is done with reference samples and data which are captured with a one-channel conventional NaI detector.http://creativecommons.org/licenses/by/4.0/Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment4181173-185 Chatzisotiriou V. Christofis I. Dimitriou Nikos K. Dre Ch. Haralabidis, Nick Karvelas S. Karydas, A.G Loukas D. Misiakos, Konstantinos Pavlidis A. Perdikatsis Vasilis Περδικατσης Βασιλης Psycharis Vassilis Spirou S. Terzis Aris Turchetta, Renato Tsoi Elisabeth Elsevier X-ray Diffractometer Powder crystallography