<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/B75148A9-8FAC-45DA-A019-A7D1EC511304"><efrbr-work:titleOfTheWork>Sputtering rates and nanoscale cluster production in a hollow-cathode apparatus</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/B75148A9-8FAC-45DA-A019-A7D1EC511304"><efrbr-expression:titleOfTheExpression>Sputtering rates and nanoscale cluster production in a hollow-cathode apparatus</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Peer-Reviewed Journal Publication
            Δημοσίευση σε Περιοδικό με Κριτές
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2015-12-02</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">1996</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>By combining a hollow-cathode plasma sputter device with the gas aggregation technique, an intense source of nanoscale metal clusters has been developed. Net sputtering rates have been measured as a function of pressure, flow velocity, electric current and cathode geometry, and in most instances they were found to behave differently than their planar-electrode sputtering counterparts. Deposition rates on substrates located away from the hot plasma region have been also measured. Clusters of Cu, Ag, Au and Ta have been produced and their size has been determined via XRD and TEM. The size of Cun clusters is found to increase with the sputter source discharge current.</efrbr-expression:summarizationOfContent><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="journal name">Nanostructured Materials</efrbr-expression:note><efrbr-expression:note type="journal volume">7</efrbr-expression:note><efrbr-expression:note type="journal number">5</efrbr-expression:note><efrbr-expression:note type="page range">473-486</efrbr-expression:note></efrbr-expression:expression><efrbr-person:person identifier="http://users.isc.tuc.gr/~akatsanos"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Katsanos Anastasios
            Κατσανος Αναστασιος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/198669853"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Clouvas, Alexandre, 19..-
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://viaf.org/viaf/66964362"><efrbr-person:nameOfPerson vocabulary="VIAF">
            Papastaikoudis, Constantin
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="6800E332-3E4D-4155-9037-2FC91DB5A68A"><efrbr-person:nameOfPerson vocabulary="">
            Potiriadis Constantinos 
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            Trouposkiadis P.
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="16C7B0A0-641F-4FC4-867A-D4CF410C64F3"><efrbr-person:nameOfPerson vocabulary="">
            Xenoulis Alexander C.
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            Elsevier
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody><efrbr-concept:concept identifier="5EA6E5A9-025D-4D0E-85CD-18CB699BED43"><efrbr-concept:termForTheConcept>
            Nanostructured materials
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