Exposure evaluation of dosimetric films by PIXEExposure evaluation of dosimetric films by PIXE Peer-Reviewed Journal Publication Δημοσίευση σε Περιοδικό με Κριτές 2015-12-021985enThe proton induced X-ray emission (PIXE) external beam method is used for the absolute determination of the fixed silver surface density on the fast and slow emulsion sides of Kodak Radiation Monitoring Type 2 films exposed to known gamma ray doses. The results are compared to those obtained by measuring optical densities. In the low dose range region doses as low as 1 mR can be accurately determined by the PIXE method. High exposures up to 800 R can be evaluated by direct measurements without the removal of the fast emulsion. The highest dose that can be measured by PIXE is only limited by the amount and grain size of the silver bromide on the slow emulsion side of the film.http://creativecommons.org/licenses/by/4.0/Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms93306-310 Katsanos Anastasios Κατσανος Αναστασιος Hadjiantoniou, Alex Elsevier