An external beam technique for proton-induced X-ray emission analysis An external beam technique for proton-induced X-ray emission analysis Peer-Reviewed Journal Publication Δημοσίευση σε Περιοδικό με Κριτές 2015-12-021976enA method for proton irradiation of targets in free air is described. A 7.6 μm beryllium foil used as a proton exit window causes negligible energy loss for as low as 2 MeV protons and can withstand relatively high currents for extended periods of time without vacuum problems. Proton-induced X-rays from thin and thick samples are detected using Si(Li) and intrinsic Ge detectors A detailed comparison of X-ray spectra obtained both with external and internal bombardment, for a variety of samples, is presented and these results clearly demonstrate the superior performance of the external beam technique for elemental micro-analysis.http://creativecommons.org/licenses/by/4.0/Nuclear Instruments and Methods1371119-124 Katsanos Anastasios Κατσανος Αναστασιος Xenoulis Alexander C. Hadjiantoniou A. Fink Richard W. Elsevier X-ray emission analysis