<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/3E0208CC-6B6C-4871-AD52-0D138E5D9D74"><efrbr-work:titleOfTheWork>An interactive environment for the transparent logic simulation and testing of integrated circuits</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/3E0208CC-6B6C-4871-AD52-0D138E5D9D74"><efrbr-expression:titleOfTheExpression>An interactive environment for the transparent logic simulation and testing of integrated circuits</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Δημοσίευση σε Συνέδριο
            Conference Publication
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2015-11-17</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">1990</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>An interactive environment utilizing a knowledge-based system for the transparent testing of integrated circuits from simulation data has been developed. Unique features of this system are its modularity and its ease of expansion with new simulators and testers. The system uses the Omnitest language and a tester description language. The environment is fully operational and has been used to test several fabricated integrated circuits. An example illustrating the operation of the system is presented.</efrbr-expression:summarizationOfContent><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="page range">394-403</efrbr-expression:note><efrbr-expression:note type="conference name">International Test Conference</efrbr-expression:note><efrbr-expression:note type="proceedings title">Proceedings of the 1990 International Test Conference </efrbr-expression:note></efrbr-expression:expression><efrbr-person:person identifier="AC4844E8-4C35-4EBA-BD50-31A4F09C1912"><efrbr-person:nameOfPerson vocabulary="">
            Castrodale G. L.
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            Dollas Apostolos
            Δολλας Αποστολος
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            Krakow W. T.
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            Institute of Electrical and Electronics Engineers
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            Automatic computers
            Automatic data processors
            Computer hardware
            Computing machines (Computers)
            Electronic brains
            Electronic calculating-machines
            Electronic computers
            Hardware, Computer
            computers
            automatic computers
            automatic data processors
            computer hardware
            computing machines computers
            electronic brains
            electronic calculating machines
            electronic computers
            hardware computer
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