<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA"><efrbr-work:titleOfTheWork>A survey on industrial vision systems, applications and tools</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA"><efrbr-expression:titleOfTheExpression>A survey on industrial vision systems, applications and tools</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Peer-Reviewed Journal Publication
            Δημοσίευση σε Περιοδικό με Κριτές
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2015-10-23</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">2003</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>The state of the art in machine vision inspection and a critical overview of real-world applications are presented in this paper. Two independent ways to classify applications are proposed, one according to the inspected features of the industrial product or process and the other according to the inspection independent characteristics of the inspected product or process. The most contemporary software and hardware tools for developing industrial vision systems are reviewed. Finally, under the light of recent advances in image sensors, software and hardware technology, important issues and directions for designing and developing industrial vision systems are identified and discussed.</efrbr-expression:summarizationOfContent><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="journal name">Image and vision computing</efrbr-expression:note><efrbr-expression:note type="journal volume">2</efrbr-expression:note><efrbr-expression:note type="journal number">21</efrbr-expression:note><efrbr-expression:note type="page range">171–188</efrbr-expression:note></efrbr-expression:expression><efrbr-person:person identifier="http://users.isc.tuc.gr/~mzervakis"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Zervakis Michalis
            Ζερβακης Μιχαλης
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="044CDCFF-C0E2-44BF-87A4-8FB9DFA63559"><efrbr-person:nameOfPerson vocabulary="">
             Laurent Petit
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="621C2BF9-83BE-4053-9AB7-44B23C6CEE6D"><efrbr-person:nameOfPerson vocabulary="">
             Jean-Didier Legat
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~epetrakis"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Petrakis Evripidis
            Πετρακης Ευριπιδης
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-corporateBody:corporateBody identifier="http://www.elsevier.com/"><efrbr-corporateBody:nameOfTheCorporateBody vocabulary="S/R:PUBLISHERS">
            Elsevier
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody></efrbr:entities><efrbr:relationships><efrbr-structure:structureRelations><efrbr-structure:realizedThrough sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="expression" targetURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA"/></efrbr-structure:structureRelations><efrbr-responsible:responsibleRelations><efrbr-responsible:createdBy sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="http://users.isc.tuc.gr/~mzervakis"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="http://users.isc.tuc.gr/~mzervakis" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="044CDCFF-C0E2-44BF-87A4-8FB9DFA63559" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="621C2BF9-83BE-4053-9AB7-44B23C6CEE6D" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="http://users.isc.tuc.gr/~epetrakis" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/F6F4FFCF-3C0E-4E33-8FE0-CD6FB73618CA" targetEntity="person" targetURI="http://www.elsevier.com/" role="publisher"/></efrbr-responsible:responsibleRelations><efrbr-subject:subjectRelations/><efrbr-other:otherRelations/></efrbr:relationships></efrbr:recordSet>