<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/608032BD-A140-4F5F-8A4A-FAAAEE2FA9BE"><efrbr-work:titleOfTheWork>Investigation of the relationship between the reflectance and the deposited nickel and tin amount on the aluminium anodic oxide film</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/608032BD-A140-4F5F-8A4A-FAAAEE2FA9BE"><efrbr-expression:titleOfTheExpression>Investigation of the relationship between the reflectance and the deposited nickel and tin amount on the aluminium anodic oxide film</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Peer-Reviewed Journal Publication
            Δημοσίευση σε Περιοδικό με Κριτές
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2015-10-09</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">1998</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>Two distinct methods were used, energy dispersive X-ray fluorescence and specular reflectance measurement, in order to analyze the amount of the nickel and tin layers on anodic aluminium surfaces. These metals were electroplated at the bottom of the pores of anodized aluminium, during electrolytic colouring in solutions containing nickel borate and boric acid, tin sulphate and sulphuric acid, respectively. An exponential relation was derived giving the absorbance of each sample as a function of the surface density of the deposited metal. Various organic additives that improve the efficiency of the electrolytic procedure were used as well as AC or DC current which affects the situation of the anodic film; their influence on the calculated parameters was also investigated.</efrbr-expression:summarizationOfContent><efrbr-expression:contextForTheExpression>Δημοσίευση σε επιστημονικό περιοδικό </efrbr-expression:contextForTheExpression><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="journal name">Thin Solid Films</efrbr-expression:note><efrbr-expression:note type="journal volume">326</efrbr-expression:note><efrbr-expression:note type="journal number">1-2</efrbr-expression:note><efrbr-expression:note type="page range">166–170</efrbr-expression:note></efrbr-expression:expression><efrbr-person:person identifier="http://users.isc.tuc.gr/~nkallithrakas"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Kallithrakas-Kontos Nikolaos
            Καλλιθρακας-Κοντος Νικολαος
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            Moshohoritou R.
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="E17FEE1E-9D81-4530-A262-179006123975"><efrbr-person:nameOfPerson vocabulary="">
            Ninni Vassilia
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            Tsangaraki-Kaplanoglou Irene
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-corporateBody:corporateBody identifier="http://www.cell.com/cellpress"><efrbr-corporateBody:nameOfTheCorporateBody vocabulary="S/R:PUBLISHERS">
            Elsevier
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody><efrbr-concept:concept identifier="F7BBDB5F-27C6-436A-A351-62E046D40542"><efrbr-concept:termForTheConcept>
            Aluminium
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="7B3646F4-4C8C-4871-99FF-61088758A3A0"><efrbr-concept:termForTheConcept>
            Anodic oxidation
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="D978AF64-FA2B-42D6-BA4A-63B151FE846D"><efrbr-concept:termForTheConcept>
            Reflection spectroscopy
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="FC596016-E3CF-4F4A-AC72-339CA2A4ABB7"><efrbr-concept:termForTheConcept>
            X-ray emission
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