<efrbr:recordSet xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:efrbr="http://vfrbr.info/efrbr/1.1" xmlns:efrbr-work="http://vfrbr.info/efrbr/1.1/work" xmlns:efrbr-expression="http://vfrbr.info/efrbr/1.1/expression" xmlns:efrbr-manifestation="http://vfrbr.info/efrbr/1.1/manifestation" xmlns:efrbr-person="http://vfrbr.info/efrbr/1.1/person" xmlns:efrbr-corporateBody="http://vfrbr.info/efrbr/1.1/corporateBody" xmlns:efrbr-concept="http://vfrbr.info/efrbr/1.1/concept" xmlns:efrbr-structure="http://vfrbr.info/efrbr/1.1/structure" xmlns:efrbr-responsible="http://vfrbr.info/efrbr/1.1/responsible" xmlns:efrbr-subject="http://vfrbr.info/efrbr/1.1/subject" xmlns:efrbr-other="http://vfrbr.info/efrbr/1.1/other" xsi:schemaLocation="http://vfrbr.info/efrbr/1.1 http://vfrbr.info/schemas/1.1/efrbr.xsd"><efrbr:entities><efrbr-work:work identifier="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9"><efrbr-work:titleOfTheWork>Study of dielectric strength of high voltage cables
</efrbr-work:titleOfTheWork></efrbr-work:work><efrbr-expression:expression identifier="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9"><efrbr-expression:titleOfTheExpression>Study of dielectric strength of high voltage cables
</efrbr-expression:titleOfTheExpression><efrbr-expression:titleOfTheExpression>Μελέτη διηλεκτρικής αντοχής καλωδίων υψηλής τάσης</efrbr-expression:titleOfTheExpression><efrbr-expression:formOfExpression vocabulary="DIAS:TYPES">
            Διπλωματική Εργασία
            Diploma Work
         </efrbr-expression:formOfExpression><efrbr-expression:dateOfExpression type="issued">2025-07-21</efrbr-expression:dateOfExpression><efrbr-expression:dateOfExpression type="published">2025</efrbr-expression:dateOfExpression><efrbr-expression:languageOfExpression vocabulary="iso639-1">en</efrbr-expression:languageOfExpression><efrbr-expression:summarizationOfContent>Reliable dielectric performance of high voltage (HV) cables is critical for power system integrity, yet the outer oversheath can present unexpected weaknesses during lightning transient events. This thesis undertakes a thorough investigation of dielectric strength in two extruded HV cable constructions—a 150 kV AL/XLPE/SWAS/PE design and a 110 kV N2XS(F)2Y variant—focusing on the cables’ oversheath behavior under impulse voltage stress. International test protocols (IEC and ASTM) that guide specimen preparation, measurement, and testing were used.
Initial evaluation revealed that factory-applied semiconductive jacket layers often exceed the thin screening film assumed in standards, creating thicknesses on the order of millimeters and resulting in small surface resistances in the kiloohm range. Such oversheath characteristics led to surface conduction and creepage discharge when applying lightning impulses, visibly carbonizing the oversheath and producing distorted waveforms with abnormally rapid tail decay and erratic discharge paths. Mechanical removal of these semiconductive layers—achieved by rasping, after abrasion proved insufficient—restored insulation surfaces to GΩ-range resistivity, eliminating leakage paths and enabling correct 1.2/50 μs waveform generation during oil-immersed impulse tests. Clean electrode installation and controlled immersion protocols ensured reproducible conditions.
For the 150 kV cable, only after complete removal of the multi-millimeter semiconductive oversheath did the impulse waveforms conform to IEC tolerances and the insulation exhibit clean puncture breakdown without lateral tracking. Similar findings are true for the 110 kV cable, where surface-resistance verification and targeted layer removal preceded successful impulse withstand tests.
Experimental container design also evolved through prototypes to address mechanical failures under high-stress impulses, culminating in a nested, oil-filled assembly that maintained dielectric clearance and structural integrity during repetitive testing. The Marx generator was analyzed, modified to a single-stage impulse voltage generator for lower voltage impulses. The produced waveforms were validated via simulations and measurements.
This work studies the dielectric strength, providing detailed procedures for oversheath assessment, mechanical removal techniques, electrode assembly, oil-immersion setup, and impulse voltage application. Finally, this study can contribute empirical dielectric-strength limits under transient stresses, supporting improved testing protocols and cable design and production evaluations.
</efrbr-expression:summarizationOfContent><efrbr-expression:summarizationOfContent>Τα καλώδια υψηλής τάσης είναι κρίσιμα στοιχεία στα δίκτυα μεταφοράς και διανομής ηλεκτρικής ενέργειας, με το έργο να μεταφέρουν με ασφάλεια μεγάλες ποσότητες ηλεκτρικής ενέργειας σε σημαντικές αποστάσεις. Ένα καθοριστικό αλλά συχνά υποτιμώμενο στοιχείο αυτών των καλωδίων είναι το μονωτικό περίβλημα, το οποίο λειτουργεί ως εξωτερική προστατευτική επένδυση. Αυτό το περίβλημα παρέχει απαραίτητη μηχανική προστασία έναντι εξωτερικών καταπονήσεων, διείσδυσης υγρασίας και περιβαλλοντικών ρύπων, καθώς και συμπληρωματική ηλεκτρική μόνωση. Παρά τη σημασία του, η διηλεκτρική ακεραιότητα του μονωτικού περιβλήματος—ιδιαίτερα υπό συνθήκες κρουστικής τάσης—θεωρείται συχνά ότι είναι επαρκής σύμφωνα με τις υπάρχουσες πρακτικές κατασκευής και τα διεθνή πρότυπα. Ωστόσο, εμπειρικά δεδομένα λειτουργίας έχουν υποδείξει πιθανές αδυναμίες στα μονωτικά περιβλήματα των καλωδίων, ειδικά όταν εκτίθενται σε μεταβατικές τάσεις που μπορεί να διαφέρουν σημαντικά από εκείνες που προβλέπονται στις τυποποιημένες δοκιμές.</efrbr-expression:summarizationOfContent><efrbr-expression:contextForTheExpression>Προπτυχιακή διατριβή που κατατέθηκε στο τμήμα ΗΜΜΥ του πολυτεχνείου κρήτης για τη λήψη προπτυχιακού διπλώματος.</efrbr-expression:contextForTheExpression><efrbr-expression:useRestrictionsOnTheExpression type="creative-commons">http://creativecommons.org/licenses/by/4.0/</efrbr-expression:useRestrictionsOnTheExpression><efrbr-expression:note type="academic unit">Πολυτεχνείο Κρήτης::Σχολή Ηλεκτρολόγων Μηχανικών και Μηχανικών Υπολογιστών</efrbr-expression:note></efrbr-expression:expression><efrbr-manifestation:manifestation identifier="https://dias.library.tuc.gr/view/104092"><efrbr-manifestation:titleOfTheManifestation>Messaritakis_Georgios_Dip_2025.pdf</efrbr-manifestation:titleOfTheManifestation><efrbr-manifestation:publicationDistribution><efrbr-manifestation:placeOfPublicationDistribution type="distribution">Chania [Greece]</efrbr-manifestation:placeOfPublicationDistribution><efrbr-manifestation:publisherDistributor type="distributor">Library of TUC</efrbr-manifestation:publisherDistributor><efrbr-manifestation:dateOfPublicationDistribution>2025-07-21</efrbr-manifestation:dateOfPublicationDistribution></efrbr-manifestation:publicationDistribution><efrbr-manifestation:formOfCarrier>application/pdf</efrbr-manifestation:formOfCarrier><efrbr-manifestation:extentOfTheCarrier>4 MB</efrbr-manifestation:extentOfTheCarrier><efrbr-manifestation:accessRestrictionsOnTheManifestation>free</efrbr-manifestation:accessRestrictionsOnTheManifestation></efrbr-manifestation:manifestation><efrbr-person:person identifier="http://users.isc.tuc.gr/~gmessaritakis"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Messaritakis Georgios
            Μεσσαριτακης Γεωργιος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~peppas"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Peppas Georgios
            Πεππας Γεωργιος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~kgyftakis"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Gyftakis Konstantinos
            Γυφτακης Κωνσταντινος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-person:person identifier="http://users.isc.tuc.gr/~ekoutroulis"><efrbr-person:nameOfPerson vocabulary="TUC:LDAP">
            Koutroulis Eftychios
            Κουτρουλης Ευτυχιος
         </efrbr-person:nameOfPerson></efrbr-person:person><efrbr-corporateBody:corporateBody identifier="BDD5AC35-EF73-4B1F-AD9E-801C0C4BA2EB"><efrbr-corporateBody:nameOfTheCorporateBody vocabulary="">
            Πολυτεχνείο Κρήτης
            Technical University of Crete
         </efrbr-corporateBody:nameOfTheCorporateBody></efrbr-corporateBody:corporateBody><efrbr-concept:concept identifier="2B8E63B2-87CF-4548-96EA-3B175674CCB2"><efrbr-concept:termForTheConcept>
            XLPE insulation
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="9CAD8B21-DB28-4DEE-A118-E8BA67DD3439"><efrbr-concept:termForTheConcept>
            Surface discharge
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="C44B0B5A-B6AD-432C-840C-A5DE18C2E3B6"><efrbr-concept:termForTheConcept>
            Semiconductive oversheath
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="FE5097CC-0F8E-4968-B7F7-D019F205C724"><efrbr-concept:termForTheConcept>
            Oversheath weak points
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="990ABCE4-91C4-4306-A8D7-0AB758D480E9"><efrbr-concept:termForTheConcept>
            Oil immersion
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="DFF2A754-AEB7-414C-A326-7A18F1051887"><efrbr-concept:termForTheConcept>
            Marx generator
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="998DF988-4FE0-49A0-A3A6-A679B722726A"><efrbr-concept:termForTheConcept>
            Impulse voltage testing
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="6BD714DB-07CE-4CE7-9EC6-9AE07C357872"><efrbr-concept:termForTheConcept>
            IEC standards
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="CE546DB8-6643-4950-BA9D-AB195BA2FF08"><efrbr-concept:termForTheConcept>
            Dielectric strength
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="FE024870-AB17-45BB-BDB2-EA5D4F89F7CA"><efrbr-concept:termForTheConcept>
            High voltage cable
         </efrbr-concept:termForTheConcept></efrbr-concept:concept><efrbr-concept:concept identifier="DB70E8CE-093B-4F95-BE76-FD479B6BE203"><efrbr-concept:termForTheConcept>
            ASTM standards
         </efrbr-concept:termForTheConcept></efrbr-concept:concept></efrbr:entities><efrbr:relationships><efrbr-structure:structureRelations><efrbr-structure:realizedThrough sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="expression" targetURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9"/><efrbr-structure:embodiedIn sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="manifestation" targetURI="http://purl.tuc.gr/dl/dias/2B04B2E7-33EA-4D7B-9C42-33884E173070"/></efrbr-structure:structureRelations><efrbr-responsible:responsibleRelations><efrbr-responsible:createdBy sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="http://users.isc.tuc.gr/~gmessaritakis"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="http://users.isc.tuc.gr/~gmessaritakis" role="author"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="http://users.isc.tuc.gr/~peppas" role="http://purl.tuc.gr/dl/dias/vocabs/contributor-roles/1"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="http://users.isc.tuc.gr/~kgyftakis" role="http://purl.tuc.gr/dl/dias/vocabs/contributor-roles/2"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="http://users.isc.tuc.gr/~ekoutroulis" role="http://purl.tuc.gr/dl/dias/vocabs/contributor-roles/2"/><efrbr-responsible:realizedBy sourceEntity="expression" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="person" targetURI="BDD5AC35-EF73-4B1F-AD9E-801C0C4BA2EB" role="publisher"/></efrbr-responsible:responsibleRelations><efrbr-subject:subjectRelations><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="2B8E63B2-87CF-4548-96EA-3B175674CCB2"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="9CAD8B21-DB28-4DEE-A118-E8BA67DD3439"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="C44B0B5A-B6AD-432C-840C-A5DE18C2E3B6"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="FE5097CC-0F8E-4968-B7F7-D019F205C724"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="990ABCE4-91C4-4306-A8D7-0AB758D480E9"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="DFF2A754-AEB7-414C-A326-7A18F1051887"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="998DF988-4FE0-49A0-A3A6-A679B722726A"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="6BD714DB-07CE-4CE7-9EC6-9AE07C357872"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="CE546DB8-6643-4950-BA9D-AB195BA2FF08"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="FE024870-AB17-45BB-BDB2-EA5D4F89F7CA"/><efrbr-subject:hasSubject sourceEntity="work" sourceURI="http://purl.tuc.gr/dl/dias/1253772D-2D5D-4FB5-8D17-2B1CCB3A4EC9" targetEntity="concept" targetURI="DB70E8CE-093B-4F95-BE76-FD479B6BE203"/></efrbr-subject:subjectRelations><efrbr-other:otherRelations/></efrbr:relationships></efrbr:recordSet>