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Technical University of Crete
Technical University of Crete
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| URI | http://purl.tuc.gr/dl/dias/C4B0BCBA-4221-4368-851E-13C1BC949A5C | - |
| Identifier | https://doi.org/10.1109/IECON48115.2021.9589334 | - |
| Identifier | https://ieeexplore.ieee.org/document/9589334 | - |
| Language | en | - |
| Extent | 5 pages | en |
| Title | Fault diagnosis and reconfiguration for H6 grid-tied inverter using Kalman filter | en |
| Creator | Xiao Chengqi | en |
| Creator | Wu Weimin | en |
| Creator | Gao Ning | en |
| Creator | Koutroulis Eftychios | en |
| Creator | Κουτρουλης Ευτυχιος | el |
| Creator | Chung Henry Shu-Hung | en |
| Creator | Blaabjerg, Frede, 1963- | en |
| Publisher | Institute of Electrical and Electronics Engineers | en |
| Content Summary | This paper presents an IGBT open-circuit fault diagnosis method based on Kalman filter model and reconfiguration algorithm for H6 grid-tied inverter. This method can detect open-circuit fault by only sampling the inductor current through Kalman filter model. Then, through the reconfiguration algorithm, the H6 grid-tied inverter is reconfigured as a Boost-type converter to identify the faulty IGBT device. The Kalman filter model can also predict the grid voltage provided to the control loop, thus saving the ac voltage sensor for the system. This method does not require extra sensors and diagnostic circuits, so it can be easily embedded in the DC/AC inverter system. | en |
| Type of Item | Δημοσίευση σε Συνέδριο | el |
| Type of Item | Conference Publication | en |
| License | http://creativecommons.org/licenses/by/4.0/ | en |
| Date of Item | 2023-05-19 | - |
| Date of Publication | 2021 | - |
| Subject | Fault diagnosis | en |
| Subject | H6 inverter | en |
| Subject | Open-circuit fault | en |
| Subject | Kalman filter | en |
| Subject | Reconfiguration | en |
| Bibliographic Citation | C. Xiao, W. Wu, N. Gao, E. Koutroulis, H. S. -H. Chung and F. Blaabjerg, "Fault diagnosis and reconfiguration for H6 grid-tied inverter using Kalman filter," presented at the IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, 2021, doi: 10.1109/IECON48115.2021.9589334. | en |
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