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Characterization and modeling of high total ionizing dose effects and low frequency noise in standard CMOS technology

Nikolaou Aristeidis

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URI: http://purl.tuc.gr/dl/dias/6478F07C-E230-450A-A4CB-CC70418BFB21
Year 2018
Type of Item Master Thesis
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Bibliographic Citation Aristeidis Nikolaou, "Characterization and modeling of high total ionizing dose effects and low frequency noise in standard CMOS technology", Master Thesis, School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece, 2018 https://doi.org/10.26233/heallink.tuc.77171
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Master Theses in Community School of Electrical and Computer Engineering

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