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X-ray powder crystallography with vertex instrumentation

Chatzisotiriou V., Christofis I. , Dimitriou Nikos K., Dre Ch., Haralabidis, Nick, Karvelas S., Karydas, A.G, Loukas D. , Misiakos, Konstantinos, Pavlidis A., Perdikatsis Vasilis, Psycharis Vassilis , Spirou S. , Terzis Aris, Turchetta, Renato, Tsoi Elisabeth

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URI: http://purl.tuc.gr/dl/dias/5DB97484-DDF0-4D8B-9CEA-CD4D529420EE
Έτος 1998
Τύπος Δημοσίευση σε Περιοδικό με Κριτές
Άδεια Χρήσης
Λεπτομέρειες
Βιβλιογραφική Αναφορά V. Chatzisotiriou, I. Christofis, N. Dimitriou, C. Dre, N. Haralabidis, S. Karvelas, A. G. Karydas, D. Loukas, K. Misiakos, A. Pavlidis, V. Perdikatsis, V. Psycharis, S. Spirou, A. Terzis, R. Turchetta and E. Tsoi, "X-ray powder crystallography with vertex instrumentation", Nucl. Instrum. Meth. Phys. Res. Sect. A, vol. 418, no. 1, pp. 173-185, Nov. 1998. doi: 10.1016/S0168-9002(98)00731-1 https://doi.org/10.1016/S0168-9002(98)00731-1
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Περίληψη

An X-ray Diffractometer for Powder Crystallography is described along with experimental results and future plans. This is an intermediate instrument toward a long linear array system. Three channels of a silicon microstrip detector, are the detecting elements in the present instrument. Each detector channel is followed by a VLSI readout chain, which consists of a charge preamplifier with pulse shaping circuitry, a discriminator, and a 16-bit counter. Control and data acquisition is performed with a custom made PC readout card. A motorized goniometer scans the angle range of interest. Calibration of the system is done with reference samples and data which are captured with a one-channel conventional NaI detector.

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