Το έργο με τίτλο Analysis of hydrogen depth profiles in a Ta-Ti sandwich film by the 15N reaction method από τον/τους δημιουργό/ούς Katsanos Anastasios, M. Pilakouta, Neskakis, Apostolos, H. Wenzl, K. H. Klatt διατίθεται με την άδεια Creative Commons Αναφορά Δημιουργού 4.0 Διεθνές
Βιβλιογραφική Αναφορά
M. Pilakouta, A. Neskakis, K. Papastaikoudis, A. A. Katsanos, H. Wenzl, and K. H. Klatt, "Analysis of hydrogen depth profiles in a Ta-Ti sandwich film by the 15N reaction method" J. Less Comm. Metals, vol. 130, pp. 525-528, Mar. 1987. doi:10.1016/0022-5088(87)90151-2
https://doi.org/10.1016/0022-5088(87)90151-2
The resonance at Full-size image (<1 K) in the reaction 1H(15N,αγ)12C has been employed as a powerful tool for the quantitative determination of hydrogen depth profiles in a thin film sandwich of tantalum and titanium on on a solid substrate. The hydrogen profiles have been investigated in vacuum in the temperature range between 25 °C and 400 °C. It is found that at 25 °C the hydrogen to metal ratios in the sandwich components tantalum and titanium are approximately 0.5 and 2 respectively.