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Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers

Papaefthimiou Spiros, A. Siokou, S. Ntais, V. Dracopoulos, G. Leftheriotis, P. Yianoulis

Απλή Εγγραφή

URIhttp://purl.tuc.gr/dl/dias/165DA9A6-B8FD-47F2-AD53-5AB3211BD5C9-
Αναγνωριστικόhttps://doi.org/10.1016/j.tsf.2006.02.077-
Γλώσσαen-
ΤίτλοςSubstrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layersen
ΔημιουργόςPapaefthimiou Spirosen
ΔημιουργόςΠαπαευθυμιου Σπυριδωνel
ΔημιουργόςA. Siokouen
ΔημιουργόςS. Ntaisen
ΔημιουργόςV. Dracopoulosen
ΔημιουργόςG. Leftheriotisen
ΔημιουργόςP. Yianoulisen
ΕκδότηςElsevieren
ΠερίληψηThin CeOx films were deposited on Indium Tin Oxide (ITO) coated glass and on Aluminium (Al) foil using electron beam evaporation. Combined analysis based on various experimental techniques has clearly revealed that the properties of the films are influenced by the substrate on which they are deposited: The CeOx/ITO films have smaller grain size and thus a larger amount of oxygen vacancies under reducing conditions than their CeOx/Al counterparts. Their morphology difference characterizes their behavior during lithiation: The CeOx/ITO films exhibit a Li+ diffusion coefficient of about one order of magnitude higher than that of the CeOx/Al films.en
ΤύποςPeer-Reviewed Journal Publicationen
ΤύποςΔημοσίευση σε Περιοδικό με Κριτέςel
Άδεια Χρήσηςhttp://creativecommons.org/licenses/by/4.0/en
Ημερομηνία2015-10-24-
Ημερομηνία Δημοσίευσης2006-
Βιβλιογραφική ΑναφοράA. Siokou, S. Ntais, V. Drakopoulos, S. Papaefthimiou, G. Leftheriotis and P. Yianoulis "Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers", Thin Solid Films , Vol. 514, no. 1–2, pp. 87–96, Aug. 2006.Doi:10.1016/j.tsf.2006.02.077. en

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