Institutional Repository [SANDBOX]
Technical University of Crete
EN  |  EL

Search

Browse

My Space

Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers

Papaefthimiou Spiros, A. Siokou, S. Ntais, V. Dracopoulos, G. Leftheriotis, P. Yianoulis

Simple record

URIhttp://purl.tuc.gr/dl/dias/165DA9A6-B8FD-47F2-AD53-5AB3211BD5C9-
Identifierhttps://doi.org/10.1016/j.tsf.2006.02.077-
Languageen-
TitleSubstrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layersen
CreatorPapaefthimiou Spirosen
CreatorΠαπαευθυμιου Σπυριδωνel
CreatorA. Siokouen
CreatorS. Ntaisen
CreatorV. Dracopoulosen
CreatorG. Leftheriotisen
CreatorP. Yianoulisen
PublisherElsevieren
Content SummaryThin CeOx films were deposited on Indium Tin Oxide (ITO) coated glass and on Aluminium (Al) foil using electron beam evaporation. Combined analysis based on various experimental techniques has clearly revealed that the properties of the films are influenced by the substrate on which they are deposited: The CeOx/ITO films have smaller grain size and thus a larger amount of oxygen vacancies under reducing conditions than their CeOx/Al counterparts. Their morphology difference characterizes their behavior during lithiation: The CeOx/ITO films exhibit a Li+ diffusion coefficient of about one order of magnitude higher than that of the CeOx/Al films.en
Type of ItemPeer-Reviewed Journal Publicationen
Type of ItemΔημοσίευση σε Περιοδικό με Κριτέςel
Licensehttp://creativecommons.org/licenses/by/4.0/en
Date of Item2015-10-24-
Date of Publication2006-
Bibliographic CitationA. Siokou, S. Ntais, V. Drakopoulos, S. Papaefthimiou, G. Leftheriotis and P. Yianoulis "Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers", Thin Solid Films , Vol. 514, no. 1–2, pp. 87–96, Aug. 2006.Doi:10.1016/j.tsf.2006.02.077. en

Services

Statistics

 

Copyright © DIAS 2013