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Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers

Papaefthimiou Spiros, A. Siokou, S. Ntais, V. Dracopoulos, G. Leftheriotis, P. Yianoulis

Πλήρης Εγγραφή

URI: http://purl.tuc.gr/dl/dias/165DA9A6-B8FD-47F2-AD53-5AB3211BD5C9
Έτος 2006
Τύπος Δημοσίευση σε Περιοδικό με Κριτές
Άδεια Χρήσης
Λεπτομέρειες
Βιβλιογραφική Αναφορά A. Siokou, S. Ntais, V. Drakopoulos, S. Papaefthimiou, G. Leftheriotis and P. Yianoulis "Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers", Thin Solid Films , Vol. 514, no. 1–2, pp. 87–96, Aug. 2006.Doi:10.1016/j.tsf.2006.02.077. https://doi.org/10.1016/j.tsf.2006.02.077
Εμφανίζεται στις Συλλογές
Δημοσιεύσεις σε Περιοδικά στην Κοινότητα Σχολή Μηχανικών Παραγωγής και Διοίκησης

Περίληψη

Thin CeOx films were deposited on Indium Tin Oxide (ITO) coated glass and on Aluminium (Al) foil using electron beam evaporation. Combined analysis based on various experimental techniques has clearly revealed that the properties of the films are influenced by the substrate on which they are deposited: The CeOx/ITO films have smaller grain size and thus a larger amount of oxygen vacancies under reducing conditions than their CeOx/Al counterparts. Their morphology difference characterizes their behavior during lithiation: The CeOx/ITO films exhibit a Li+ diffusion coefficient of about one order of magnitude higher than that of the CeOx/Al films.

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