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Chemical state speciation by resonant Raman scattering

Karydas, A.G, Galanopoulos S., Zarkadas, Ch, Kallithrakas-Kontos Nikolaos, Paradellis, T

Πλήρης Εγγραφή


URI: http://purl.tuc.gr/dl/dias/B6FA5D06-0164-4769-AF95-F182CC61DF27
Έτος 2002
Τύπος Δημοσίευση σε Περιοδικό με Κριτές
Άδεια Χρήσης
Λεπτομέρειες
Βιβλιογραφική Αναφορά A. G. Karydas, S. Galanopoulos, Ch. Zarkadas, T. Paradellis and N. Kallithrakas-Kontos, "Chemical state speciation by resonant Raman scattering", J. Phys. Condens. Matter, vol. 14, no. 47, pp. 12367-12381, Nov. 2002. doi: 10.1088/0953-8984/14/47/311 https://doi.org/10.1088/0953-8984/14/47/311
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Περίληψη

In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies.

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