URI | http://purl.tuc.gr/dl/dias/936C1BF1-6ED8-4C82-88B2-2968B1C852F7 | - |
Identifier | http://www.tuc.gr/fileadmin/users_data/elci/Kalaitzakis/J.28.pdf | - |
Identifier | https://doi.org/10.1109/TIE.2003.817706 | - |
Language | en | - |
Extent | 10 | en |
Title | Designing a new generalized battery management system. | en |
Creator | Chatzakis J. | en |
Creator | Kalaitzakis Kostas | en |
Creator | Καλαϊτζακης Κωστας | el |
Creator | Voulgaris N. | en |
Creator | Manias S. | en |
Publisher | Institute of Electrical and Electronics Engineers | en |
Description | Δημοσίευση σε επιστημονικό περιοδικό | el |
Content Summary | Battery management systems (BMSs) are used in many battery-operated industrial and commercial systems to make the battery operation more efficient and the estimation of battery state nondestructive. The existing BMS techniques are examined in this paper and a new design methodology for a generalized reliable BMS is proposed. The main advantage of the proposed BMS compared to the existing systems is that it provides a fault-tolerant capability and battery protection. The proposed BMS consists of a number of smart battery modules (SBMs) each of which provides battery equalization, monitoring, and battery protection to a string of battery cells. An evaluation SBM was developed and tested in the laboratory and experimental results verify the theoretical expectations. | en |
Type of Item | Peer-Reviewed Journal Publication | en |
Type of Item | Δημοσίευση σε Περιοδικό με Κριτές | el |
License | http://creativecommons.org/licenses/by/4.0/ | en |
Date of Item | 2015-10-01 | - |
Date of Publication | 2003 | - |
Subject | Battery management systems | en |
Subject | Design methodology | en |
Subject | Fault tolerance | en |
Subject | Fault tolerant systems | en |
Subject | battery monitoring | en |
Subject | battery protection | en |
Bibliographic Citation | J. Chatzakis, K. Kalaitzakis, N. Voulgaris, S. Manias, "Designing a new generalized battery management system," IEEE Trans. on Industrial Electronics, vol. 50, no. 5, pp. 990-999, Oct. 2003. doi:10.1109/TIE.2003.817706 | en |