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Multi-classifier approaches for post-placement surface-mount devices quality assessment

Γκούμας Στέφανος Κ.

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URI: http://purl.tuc.gr/dl/dias/034521C5-525F-408A-886D-C6176AF996A5
Year 2008
Type of Item Διδακτορική Διατριβή
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Bibliographic Citation Στέφανος Κ. Γκούμας, "Multi-classifier approaches for post-placement surface-mount devices quality assessment", Διδακτορική Διατριβή, Τμήμα Ηλεκτρονικών Μηχανικών και Μηχανικών Υπολογιστών, Πολυτεχνείο Κρήτης, Χανιά, Ελλάς, 2008. https://doi.org/10.26233/heallink.tuc.13885
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Summary

Introduction 2. Fundamental concepts of industrial machine vision inspection systems 3. The problem of surface mount devices printed circuit boards post placement quality inspection 4. Algorithms concepts 5. A Bayesian framework for multi-lead SMD post-placement quality inspection 6. Data-space reduction using topological and projection features for component quality inspection 7. Combination of multiple classifiers for post placement quality inspection of components: a comparative study 8. Combining multiple classifiers using reduced dimensionality distinct pattern representations for post placement quality inspection of components 9. Conclusions and future research

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