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Multi-classifier approaches for post-placement surface-mount devices quality assessment

Γκούμας Στέφανος Κ.

Πλήρης Εγγραφή

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Περίληψη

Introduction 2. Fundamental concepts of industrial machine vision inspection systems 3. The problem of surface mount devices printed circuit boards post placement quality inspection 4. Algorithms concepts 5. A Bayesian framework for multi-lead SMD post-placement quality inspection 6. Data-space reduction using topological and projection features for component quality inspection 7. Combination of multiple classifiers for post placement quality inspection of components: a comparative study 8. Combining multiple classifiers using reduced dimensionality distinct pattern representations for post placement quality inspection of components 9. Conclusions and future research

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