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Methods for determination of the layer charge of smectites: a critical assessment of existing approaches

Christidis Georgios, Chryssikos G. D., Derkowski A., Dohrmann R., Eberl D. D., Joussein E., Kaufhold S.

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URIhttp://purl.tuc.gr/dl/dias/F771EE96-75DB-416B-B5A0-984288414B77-
Identifierhttps://doi.org/10.1007/s42860-023-00234-8-
Identifierhttps://www.cambridge.org/core/product/AA0065A6D5CADBC16393FE9DCAB6CCE1-
Languageen-
Extent29 pagesen
TitleMethods for determination of the layer charge of smectites: a critical assessment of existing approachesen
CreatorChristidis Georgiosen
CreatorΧρηστιδης Γεωργιοςel
CreatorChryssikos G. D.en
CreatorDerkowski A.en
CreatorDohrmann R.en
CreatorEberl D. D.en
CreatorJoussein E.en
CreatorKaufhold S.en
PublisherCambridge University Pressen
Content SummaryLayer charge is an important property of 2:1 phyllosilicates originating from isomorphic substitutions in the structure, from vacancies in the octahedral sheet and from unsatisfied bonds at the edges of the crystals. It is of particular interest in the case of smectites because it affects important properties of this mineral. Several methods have been proposed for determining the layer charge of smectites, namely the structural formula method (SFM), the alkylammonium method (AAM), the NH4-method, the K-saturation method, and the O-D method. Most of these methods have been used extensively in the past and they all have advantages and shortcomings. The SFM and the AAM are based on different principles and are considered as primary methods. They have been used for a long time but they are time consuming and they provide contrasting layer charge values, with the AAM yielding consistently lower layer charge values than the SFM, especially for low-charge smectites. The remaining methods have been developed more recently and have been calibrated over their primary counterparts. They are applied easily and are capable of producing a large amount of data within a short time. In this sense they can be used both for geological interpretations and for assessment of bentonite deposits at an industrial scale.en
Type of ItemΑνασκόπησηel
Type of ItemReviewen
Licensehttp://creativecommons.org/licenses/by/4.0/en
Date of Item2025-08-22-
Date of Publication2023-
SubjectAlkylammonium methoden
SubjectK-saturation methoden
SubjectLayer chargeen
SubjectNH4-methoden
SubjectO-D methoden
SubjectSmectiteen
SubjectStructural formula methoden
Bibliographic CitationG. E. Christidis, G. D. Chryssikos, A. Derkowski, R. Dohrmann, D. D. Eberl, E. Joussein and S. Kaufhold “Methods for determination of the layer charge of smectites: a critical assessment of existing approaches,” Clays Clay Miner., vol. 71, no. 1, pp. 25–53, Feb. 2023, doi:10.1007/s42860-023-00234-8.en

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